期刊簡介預(yù)計(jì)審稿時(shí)間： 約3.0個(gè)月

Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.

The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.

Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.

《微電子學(xué)雜志》自 1969 年創(chuàng)刊以來，是一個(gè)傳播微電子系統(tǒng)、電路和新興技術(shù)研究和應(yīng)用的國際論壇?！段㈦娮訉W(xué)雜志》上發(fā)表的論文都經(jīng)過同行評(píng)審，以確保其原創(chuàng)性、相關(guān)性和時(shí)效性。因此，該雜志提供了有關(guān)微電子電路和系統(tǒng)的全球定期全面更新。

《微電子學(xué)雜志》誠邀撰寫描述以下所有領(lǐng)域重要研究和應(yīng)用的論文。涵蓋最新發(fā)展的綜合評(píng)論/調(diào)查論文也將予以考慮?！段㈦娮訉W(xué)雜志》涵蓋電路和系統(tǒng)。該主題包括但不限于：模擬、數(shù)字、混合和射頻電路及相關(guān)設(shè)計(jì)方法；邏輯、架構(gòu)和系統(tǒng)級(jí)綜合；測試、可測試性設(shè)計(jì)、內(nèi)置自測試；面積、功率和熱分析與設(shè)計(jì)；混合域仿真與設(shè)計(jì)；嵌入式系統(tǒng)；非馮諾依曼計(jì)算及相關(guān)技術(shù)和電路；高復(fù)雜度系統(tǒng)集成的設(shè)計(jì)和測試； SoC、NoC、SIP 和 NIP 設(shè)計(jì)和測試；3-D 集成設(shè)計(jì)和分析；新興器件技術(shù)和電路，如 FinFET、SET、自旋電子學(xué)、SFQ、MTJ 等。

也歡迎應(yīng)用方面，例如信號(hào)和圖像處理（包括密碼電路）、傳感器和執(zhí)行器（包括傳感器網(wǎng)絡(luò)）、可靠性和質(zhì)量問題以及經(jīng)濟(jì)模型。

《Microelectronics Journal》(微電子雜志)編輯部通訊方式為ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OXON, OX5 1GB。如果您需要協(xié)助投稿或潤稿服務(wù)，您可以咨詢我們的客服老師。我們專注于期刊投稿服務(wù)十年，熟悉發(fā)表政策，可為您提供一對(duì)一投稿指導(dǎo)，避免您在投稿時(shí)頻繁碰壁，節(jié)省您的寶貴時(shí)間，有效提升發(fā)表機(jī)率，確保SCI檢索（檢索不了全額退款）。我們視信譽(yù)為生命，多方面確保文章安全保密，在任何情況下都不會(huì)泄露您的個(gè)人信息或稿件內(nèi)容。